JPH044284U - - Google Patents
Info
- Publication number
- JPH044284U JPH044284U JP4467990U JP4467990U JPH044284U JP H044284 U JPH044284 U JP H044284U JP 4467990 U JP4467990 U JP 4467990U JP 4467990 U JP4467990 U JP 4467990U JP H044284 U JPH044284 U JP H044284U
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- circuit pattern
- probing
- inspected
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 13
- 238000000034 method Methods 0.000 claims 2
- 230000007547 defect Effects 0.000 claims 1
- 230000002950 deficient Effects 0.000 claims 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Description
第１図は、本考案の一実施例を示す機能ブロツ
ク図、第２図は、第１図の装置における動作を示
すフローチヤート図、第３図は、従来の技術の一
例を示すフローチヤート図である。
１……検査部、３……制御部、５……フオール
トフアイル。
FIG. 1 is a functional block diagram showing an embodiment of the present invention, FIG. 2 is a flowchart showing the operation of the device shown in FIG. 1, and FIG. 3 is a flowchart showing an example of a conventional technique. It is. 1... Inspection section, 3... Control section, 5... Fault file.
Claims (1)
パツドをプロービングして検査するプロービング
方式による回路パターン検査装置であつて、 検査するプリント基板をセツトすると、前記検
査対象パツドを物理的にプロービングして検査す
る検査部と、 回路パターンの検査結果を格納するフアイルと
、 前記検査部から入力した検査結果を前記フアイ
ルに格納し、全回路パターンの検査が終了後に、
不良箇所があれば前記検査部にプリント基板を再
セツトし、前記検査結果による再検査を実施して
検査結果の擬似不良をなくする制御部とを有する
ことを特徴とするプロービング方式による回路パ
ターン検査装置。[Claims for Utility Model Registration] A circuit pattern inspection device using a probing method that inspects pads to be inspected in a circuit pattern of a printed circuit board by probing the circuit pattern, which physically inspects the pads to be inspected when the printed circuit board to be inspected is set. An inspection unit that performs probing and inspection; a file that stores the inspection results of the circuit pattern; and the inspection results input from the inspection unit are stored in the file, and after the inspection of all circuit patterns is completed,
A circuit pattern inspection using a probing method, comprising a control section that resets the printed circuit board in the inspection section if there is a defective part, and performs a re-inspection based on the inspection results to eliminate false defects in the inspection results. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4467990U JPH044284U (en) | 1990-04-27 | 1990-04-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4467990U JPH044284U (en) | 1990-04-27 | 1990-04-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH044284U true JPH044284U (en) | 1992-01-16 |
Family
ID=31558200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4467990U Pending JPH044284U (en) | 1990-04-27 | 1990-04-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH044284U (en) |
-
1990
- 1990-04-27 JP JP4467990U patent/JPH044284U/ja active Pending
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