JPS6288334A - 誘電体絶縁分離基板の製造方法 - Google Patents
誘電体絶縁分離基板の製造方法Info
- Publication number
- JPS6288334A JPS6288334A JP23020285A JP23020285A JPS6288334A JP S6288334 A JPS6288334 A JP S6288334A JP 23020285 A JP23020285 A JP 23020285A JP 23020285 A JP23020285 A JP 23020285A JP S6288334 A JPS6288334 A JP S6288334A
- Authority
- JP
- Japan
- Prior art keywords
- voltage element
- withstand voltage
- element portion
- single crystal
- depth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 22
- 238000004519 manufacturing process Methods 0.000 title claims description 11
- 238000009413 insulation Methods 0.000 title description 3
- 238000005530 etching Methods 0.000 claims abstract description 26
- 238000000034 method Methods 0.000 claims abstract description 14
- 239000004065 semiconductor Substances 0.000 claims description 6
- 230000000873 masking effect Effects 0.000 claims description 2
- 239000013078 crystal Substances 0.000 claims 4
- 239000010409 thin film Substances 0.000 claims 2
- 239000010408 film Substances 0.000 claims 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 abstract description 34
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 14
- 229910052710 silicon Inorganic materials 0.000 abstract description 14
- 239000010703 silicon Substances 0.000 abstract description 14
- 238000000206 photolithography Methods 0.000 abstract description 11
- 239000000463 material Substances 0.000 abstract description 6
- 230000015572 biosynthetic process Effects 0.000 abstract description 2
- 230000015556 catabolic process Effects 0.000 description 16
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 15
- 238000005516 engineering process Methods 0.000 description 6
- 239000012535 impurity Substances 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 238000002955 isolation Methods 0.000 description 4
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 3
- 239000007864 aqueous solution Substances 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Landscapes
- Element Separation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23020285A JPS6288334A (ja) | 1985-10-15 | 1985-10-15 | 誘電体絶縁分離基板の製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23020285A JPS6288334A (ja) | 1985-10-15 | 1985-10-15 | 誘電体絶縁分離基板の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6288334A true JPS6288334A (ja) | 1987-04-22 |
| JPH0574939B2 JPH0574939B2 (de) | 1993-10-19 |
Family
ID=16904177
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23020285A Granted JPS6288334A (ja) | 1985-10-15 | 1985-10-15 | 誘電体絶縁分離基板の製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6288334A (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63268253A (ja) * | 1987-04-24 | 1988-11-04 | Matsushita Electric Works Ltd | 絶縁層分離基板およびその製法 |
| US6833602B1 (en) * | 2002-09-06 | 2004-12-21 | Lattice Semiconductor Corporation | Device having electrically isolated low voltage and high voltage regions and process for fabricating the device |
-
1985
- 1985-10-15 JP JP23020285A patent/JPS6288334A/ja active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63268253A (ja) * | 1987-04-24 | 1988-11-04 | Matsushita Electric Works Ltd | 絶縁層分離基板およびその製法 |
| US6833602B1 (en) * | 2002-09-06 | 2004-12-21 | Lattice Semiconductor Corporation | Device having electrically isolated low voltage and high voltage regions and process for fabricating the device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0574939B2 (de) | 1993-10-19 |
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