PL371405A1 - Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku - Google Patents

Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku

Info

Publication number
PL371405A1
PL371405A1 PL371405A PL37140504A PL371405A1 PL 371405 A1 PL371405 A1 PL 371405A1 PL 371405 A PL371405 A PL 371405A PL 37140504 A PL37140504 A PL 37140504A PL 371405 A1 PL371405 A1 PL 371405A1
Authority
PL
Poland
Prior art keywords
gallium
seed
larger
monocrystals
volumetric
Prior art date
Application number
PL371405A
Other languages
English (en)
Inventor
Robert Dwiliński
Roman Doradziński
Jerzy Garczyński
Leszek P. Sierzputowski
Yasuo Kanbara
Original Assignee
Ammono Sp.Z O.O.
Nichia Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ammono Sp.Z O.O., Nichia Corporation filed Critical Ammono Sp.Z O.O.
Priority to PL371405A priority Critical patent/PL371405A1/pl
Priority to KR1020077014483A priority patent/KR101419940B1/ko
Priority to PCT/JP2005/022396 priority patent/WO2006057463A1/en
Priority to JP2007525083A priority patent/JP5291932B2/ja
Priority to EP05814406.4A priority patent/EP1859477B1/en
Priority to CNB200580040008XA priority patent/CN100565800C/zh
Priority to US11/791,716 priority patent/US7905957B2/en
Priority to PL05814406T priority patent/PL1859477T3/pl
Publication of PL371405A1 publication Critical patent/PL371405A1/pl

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/38—Nitrides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/30—Structure or shape of the active region; Materials used for the active region
    • H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403—AIII-nitrides
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
    • C30B29/403—AIII-nitrides
    • C30B29/406—Gallium nitride
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B7/00—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions
    • C30B7/10—Single-crystal growth from solutions using solvents which are liquid at normal temperature, e.g. aqueous solutions by application of pressure, e.g. hydrothermal processes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2301/00—Functional characteristics
    • H01S2301/17—Semiconductor lasers comprising special layers
    • H01S2301/173—The laser chip comprising special buffer layers, e.g. dislocation prevention or reduction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2304/00—Special growth methods for semiconductor lasers
    • H01S2304/04—MOCVD or MOVPE
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/2205—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers
    • H01S5/2214—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure comprising special burying or current confinement layers based on oxides or nitrides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
    • H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
    • H01S5/223—Buried stripe structure
    • H01S5/2231—Buried stripe structure with inner confining structure only between the active layer and the upper electrode

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Inorganic Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Nanotechnology (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
PL371405A 2004-11-26 2004-11-26 Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku PL371405A1 (pl)

Priority Applications (8)

Application Number Priority Date Filing Date Title
PL371405A PL371405A1 (pl) 2004-11-26 2004-11-26 Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
KR1020077014483A KR101419940B1 (ko) 2004-11-26 2005-11-28 알칼리 금속 이온을 이용한 초임계 암모니아에서의 질화물단결정 시드 성장
PCT/JP2005/022396 WO2006057463A1 (en) 2004-11-26 2005-11-28 Nitride single crystal seeded growth in supercritical ammonia with alkali metal ion
JP2007525083A JP5291932B2 (ja) 2004-11-26 2005-11-28 単結晶の製造方法、及びガリウム含有窒化物のバルク単結晶
EP05814406.4A EP1859477B1 (en) 2004-11-26 2005-11-28 Nitride single crystal seeded growth in supercritical ammonia with alkali metal ions
CNB200580040008XA CN100565800C (zh) 2004-11-26 2005-11-28 获得单晶含镓氮化物衬底的方法和单晶
US11/791,716 US7905957B2 (en) 2004-11-26 2005-11-28 Method of obtaining bulk single crystals by seeded growth
PL05814406T PL1859477T3 (pl) 2004-11-26 2005-11-28 Wzrost monokryształów azotku metodą wzrostu na zarodku w nadkrytycznym amoniaku z jonami metali alkalicznych

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PL371405A PL371405A1 (pl) 2004-11-26 2004-11-26 Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku

Publications (1)

Publication Number Publication Date
PL371405A1 true PL371405A1 (pl) 2006-05-29

Family

ID=36088253

Family Applications (2)

Application Number Title Priority Date Filing Date
PL371405A PL371405A1 (pl) 2004-11-26 2004-11-26 Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
PL05814406T PL1859477T3 (pl) 2004-11-26 2005-11-28 Wzrost monokryształów azotku metodą wzrostu na zarodku w nadkrytycznym amoniaku z jonami metali alkalicznych

Family Applications After (1)

Application Number Title Priority Date Filing Date
PL05814406T PL1859477T3 (pl) 2004-11-26 2005-11-28 Wzrost monokryształów azotku metodą wzrostu na zarodku w nadkrytycznym amoniaku z jonami metali alkalicznych

Country Status (7)

Country Link
US (1) US7905957B2 (pl)
EP (1) EP1859477B1 (pl)
JP (1) JP5291932B2 (pl)
KR (1) KR101419940B1 (pl)
CN (1) CN100565800C (pl)
PL (2) PL371405A1 (pl)
WO (1) WO2006057463A1 (pl)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2267197A1 (en) 2009-06-25 2010-12-29 AMMONO Sp.z o.o. Method of obtaining bulk mono-crystalline gallium-containing nitride, bulk mono-crystalline gallium-containing nitride, substrates manufactured thereof and devices manufactured on such substrates

Families Citing this family (96)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4116535B2 (ja) * 2001-06-06 2008-07-09 アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン ガリウム含有窒化物の単結晶の製造法及び装置
US7057211B2 (en) * 2001-10-26 2006-06-06 Ammono Sp. Zo.O Nitride semiconductor laser device and manufacturing method thereof
PL225427B1 (pl) * 2002-05-17 2017-04-28 Ammono Spółka Z Ograniczoną Odpowiedzialnością Struktura urządzenia emitującego światło, zwłaszcza do półprzewodnikowego urządzenia laserowego
US20060138431A1 (en) * 2002-05-17 2006-06-29 Robert Dwilinski Light emitting device structure having nitride bulk single crystal layer
TWI334890B (en) * 2002-12-11 2010-12-21 Ammono Sp Zoo Process for obtaining bulk mono-crystalline gallium-containing nitride, eliminating impurities from the obtained crystal and manufacturing substrates made of bulk mono-crystalline gallium-containing nitride
ATE445722T1 (de) 2002-12-11 2009-10-15 Ammono Sp Zoo Schabloneartiges substrat und verfahren zu seiner herstellung
US7323256B2 (en) * 2003-11-13 2008-01-29 Cree, Inc. Large area, uniformly low dislocation density GaN substrate and process for making the same
KR100848380B1 (ko) 2004-06-11 2008-07-25 암모노 에스피. 제트오. 오. 갈륨 함유 질화물의 벌크 단결정 및 그의 어플리케이션
PL371405A1 (pl) 2004-11-26 2006-05-29 Ammono Sp.Z O.O. Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
US9885121B2 (en) 2006-04-07 2018-02-06 Sixpoint Materials, Inc. High pressure reactor and method of growing group III nitride crystals in supercritical ammonia
US9803293B2 (en) 2008-02-25 2017-10-31 Sixpoint Materials, Inc. Method for producing group III-nitride wafers and group III-nitride wafers
US8764903B2 (en) 2009-05-05 2014-07-01 Sixpoint Materials, Inc. Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride
US20100095882A1 (en) * 2008-10-16 2010-04-22 Tadao Hashimoto Reactor design for growing group iii nitride crystals and method of growing group iii nitride crystals
JP5044311B2 (ja) * 2006-09-13 2012-10-10 日本碍子株式会社 窒化物単結晶の育成方法
US8458262B2 (en) * 2006-12-22 2013-06-04 At&T Mobility Ii Llc Filtering spam messages across a communication network
JP5774476B2 (ja) * 2008-05-28 2015-09-09 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 六方晶系ウルツ鉱単結晶
US20100075107A1 (en) * 2008-05-28 2010-03-25 The Regents Of The University Of California Hexagonal wurtzite single crystal and hexagonal wurtzite single crystal substrate
WO2009149299A1 (en) * 2008-06-04 2009-12-10 Sixpoint Materials Methods for producing improved crystallinty group iii-nitride crystals from initial group iii-nitride seed by ammonothermal growth
WO2009149300A1 (en) * 2008-06-04 2009-12-10 Sixpoint Materials High-pressure vessel for growing group iii nitride crystals and method of growing group iii nitride crystals using high-pressure vessel and group iii nitride crystal
US8097081B2 (en) 2008-06-05 2012-01-17 Soraa, Inc. High pressure apparatus and method for nitride crystal growth
US9157167B1 (en) 2008-06-05 2015-10-13 Soraa, Inc. High pressure apparatus and method for nitride crystal growth
US8871024B2 (en) 2008-06-05 2014-10-28 Soraa, Inc. High pressure apparatus and method for nitride crystal growth
EP2286007B1 (en) 2008-06-12 2018-04-04 SixPoint Materials, Inc. Method for testing gallium nitride wafers and method for producing gallium nitride wafers
US8303710B2 (en) * 2008-06-18 2012-11-06 Soraa, Inc. High pressure apparatus and method for nitride crystal growth
US20100003492A1 (en) * 2008-07-07 2010-01-07 Soraa, Inc. High quality large area bulk non-polar or semipolar gallium based substrates and methods
WO2011044554A1 (en) 2009-10-09 2011-04-14 Soraa, Inc. Method for synthesis of high quality large area bulk gallium based crystals
US9404197B2 (en) 2008-07-07 2016-08-02 Soraa, Inc. Large area, low-defect gallium-containing nitride crystals, method of making, and method of use
US20120000415A1 (en) * 2010-06-18 2012-01-05 Soraa, Inc. Large Area Nitride Crystal and Method for Making It
US8124996B2 (en) * 2008-08-04 2012-02-28 Soraa, Inc. White light devices using non-polar or semipolar gallium containing materials and phosphors
US8284810B1 (en) 2008-08-04 2012-10-09 Soraa, Inc. Solid state laser device using a selected crystal orientation in non-polar or semi-polar GaN containing materials and methods
US8979999B2 (en) 2008-08-07 2015-03-17 Soraa, Inc. Process for large-scale ammonothermal manufacturing of gallium nitride boules
US8021481B2 (en) 2008-08-07 2011-09-20 Soraa, Inc. Process and apparatus for large-scale manufacturing of bulk monocrystalline gallium-containing nitride
US10036099B2 (en) 2008-08-07 2018-07-31 Slt Technologies, Inc. Process for large-scale ammonothermal manufacturing of gallium nitride boules
US8430958B2 (en) 2008-08-07 2013-04-30 Soraa, Inc. Apparatus and method for seed crystal utilization in large-scale manufacturing of gallium nitride
CN102144052A (zh) * 2008-08-07 2011-08-03 Soraa有限公司 大规模氨热制备氮化镓晶棒的方法
US8323405B2 (en) * 2008-08-07 2012-12-04 Soraa, Inc. Process and apparatus for growing a crystalline gallium-containing nitride using an azide mineralizer
US8148801B2 (en) 2008-08-25 2012-04-03 Soraa, Inc. Nitride crystal with removable surface layer and methods of manufacture
US7976630B2 (en) 2008-09-11 2011-07-12 Soraa, Inc. Large-area seed for ammonothermal growth of bulk gallium nitride and method of manufacture
US8354679B1 (en) 2008-10-02 2013-01-15 Soraa, Inc. Microcavity light emitting diode method of manufacture
US8455894B1 (en) 2008-10-17 2013-06-04 Soraa, Inc. Photonic-crystal light emitting diode and method of manufacture
US8852341B2 (en) 2008-11-24 2014-10-07 Sixpoint Materials, Inc. Methods for producing GaN nutrient for ammonothermal growth
US8878230B2 (en) 2010-03-11 2014-11-04 Soraa, Inc. Semi-insulating group III metal nitride and method of manufacture
US9589792B2 (en) 2012-11-26 2017-03-07 Soraa, Inc. High quality group-III metal nitride crystals, methods of making, and methods of use
US9543392B1 (en) 2008-12-12 2017-01-10 Soraa, Inc. Transparent group III metal nitride and method of manufacture
USRE47114E1 (en) 2008-12-12 2018-11-06 Slt Technologies, Inc. Polycrystalline group III metal nitride with getter and method of making
US8987156B2 (en) 2008-12-12 2015-03-24 Soraa, Inc. Polycrystalline group III metal nitride with getter and method of making
US8461071B2 (en) 2008-12-12 2013-06-11 Soraa, Inc. Polycrystalline group III metal nitride with getter and method of making
JP2012516572A (ja) * 2009-01-30 2012-07-19 エイエムジー・アイデアルキャスト・ソーラー・コーポレーション シード層及びシード層の製造方法
US8299473B1 (en) 2009-04-07 2012-10-30 Soraa, Inc. Polarized white light devices using non-polar or semipolar gallium containing materials and transparent phosphors
US8306081B1 (en) 2009-05-27 2012-11-06 Soraa, Inc. High indium containing InGaN substrates for long wavelength optical devices
US9250044B1 (en) 2009-05-29 2016-02-02 Soraa Laser Diode, Inc. Gallium and nitrogen containing laser diode dazzling devices and methods of use
US9800017B1 (en) 2009-05-29 2017-10-24 Soraa Laser Diode, Inc. Laser device and method for a vehicle
US8509275B1 (en) 2009-05-29 2013-08-13 Soraa, Inc. Gallium nitride based laser dazzling device and method
WO2010140564A1 (ja) * 2009-06-01 2010-12-09 三菱化学株式会社 窒化物半導体結晶およびその製造方法
US8435347B2 (en) 2009-09-29 2013-05-07 Soraa, Inc. High pressure apparatus with stackable rings
JP5445105B2 (ja) * 2009-12-18 2014-03-19 三菱化学株式会社 Iii族窒化物結晶の製造方法及びiii族窒化物結晶
TW201200646A (en) * 2010-03-15 2012-01-01 Univ California Group-III nitride crystal ammonothermally grown using an initially off-oriented non-polar or semi-polar growth surface of a group-III nitride seed crystal
US9564320B2 (en) 2010-06-18 2017-02-07 Soraa, Inc. Large area nitride crystal and method for making it
US8729559B2 (en) 2010-10-13 2014-05-20 Soraa, Inc. Method of making bulk InGaN substrates and devices thereon
JP2013541491A (ja) * 2010-10-29 2013-11-14 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 相互に対して鋭角、直角、または鈍角を成す少なくとも2つの表面を有する種におけるiii族窒化物結晶のアモノサーマル成長法
CN101962804B (zh) * 2010-10-30 2012-05-02 北京大学 基于外延材料应力控制的GaN厚膜自分离方法
US8786053B2 (en) 2011-01-24 2014-07-22 Soraa, Inc. Gallium-nitride-on-handle substrate materials and devices and method of manufacture
CN102644115A (zh) * 2011-02-22 2012-08-22 Soraa有限公司 用于大规模氨热制造氮化镓晶棒的装置和方法
US8971018B2 (en) 2011-06-27 2015-03-03 Sixpoint Materials, Inc. Ultracapacitors using transition metal nitride-containing electrode and transition metal nitride
WO2013010117A1 (en) * 2011-07-13 2013-01-17 The Regents Of The University Of California Growing a group-iii nitride crystal using a flux growth and then using the group-iii nitride crystal as a seed for an ammonothermal re-growth
US8492185B1 (en) 2011-07-14 2013-07-23 Soraa, Inc. Large area nonpolar or semipolar gallium and nitrogen containing substrate and resulting devices
US9694158B2 (en) 2011-10-21 2017-07-04 Ahmad Mohamad Slim Torque for incrementally advancing a catheter during right heart catheterization
US10029955B1 (en) 2011-10-24 2018-07-24 Slt Technologies, Inc. Capsule for high pressure, high temperature processing of materials and methods of use
US8482104B2 (en) 2012-01-09 2013-07-09 Soraa, Inc. Method for growth of indium-containing nitride films
JP6106932B2 (ja) * 2012-03-19 2017-04-05 株式会社リコー 13族窒化物結晶、及び13族窒化物結晶基板
US10145026B2 (en) 2012-06-04 2018-12-04 Slt Technologies, Inc. Process for large-scale ammonothermal manufacturing of semipolar gallium nitride boules
US9275912B1 (en) 2012-08-30 2016-03-01 Soraa, Inc. Method for quantification of extended defects in gallium-containing nitride crystals
US9299555B1 (en) 2012-09-28 2016-03-29 Soraa, Inc. Ultrapure mineralizers and methods for nitride crystal growth
US9761763B2 (en) 2012-12-21 2017-09-12 Soraa, Inc. Dense-luminescent-materials-coated violet LEDs
WO2014129544A1 (ja) * 2013-02-22 2014-08-28 三菱化学株式会社 周期表第13族金属窒化物結晶およびその製造方法
US9650723B1 (en) 2013-04-11 2017-05-16 Soraa, Inc. Large area seed crystal for ammonothermal crystal growth and method of making
CN104818520A (zh) * 2015-04-15 2015-08-05 南通大学 定向凝固铸锭用籽晶拼接结构
CN104818528A (zh) * 2015-04-15 2015-08-05 南通大学 适用于定向凝固法类单晶硅铸锭的籽晶拼接结构
CN104775156A (zh) * 2015-04-15 2015-07-15 南通大学 适用于定向凝固铸锭的籽晶拼接结构
EP3314044B1 (en) * 2015-06-25 2019-04-17 SixPoint Materials, Inc. High pressure reactor and method of growing group iii nitride crystals in supercritical ammonia
US11437774B2 (en) 2015-08-19 2022-09-06 Kyocera Sld Laser, Inc. High-luminous flux laser-based white light source
WO2017154701A1 (ja) * 2016-03-08 2017-09-14 株式会社サイオクス 窒化物結晶基板
US10174438B2 (en) 2017-03-30 2019-01-08 Slt Technologies, Inc. Apparatus for high pressure reaction
US11239637B2 (en) 2018-12-21 2022-02-01 Kyocera Sld Laser, Inc. Fiber delivered laser induced white light system
US11421843B2 (en) 2018-12-21 2022-08-23 Kyocera Sld Laser, Inc. Fiber-delivered laser-induced dynamic light system
US11466384B2 (en) 2019-01-08 2022-10-11 Slt Technologies, Inc. Method of forming a high quality group-III metal nitride boule or wafer using a patterned substrate
US12000552B2 (en) 2019-01-18 2024-06-04 Kyocera Sld Laser, Inc. Laser-based fiber-coupled white light system for a vehicle
US12152742B2 (en) 2019-01-18 2024-11-26 Kyocera Sld Laser, Inc. Laser-based light guide-coupled wide-spectrum light system
US11884202B2 (en) 2019-01-18 2024-01-30 Kyocera Sld Laser, Inc. Laser-based fiber-coupled white light system
US12091771B2 (en) 2020-02-11 2024-09-17 Slt Technologies, Inc. Large area group III nitride crystals and substrates, methods of making, and methods of use
US11721549B2 (en) 2020-02-11 2023-08-08 Slt Technologies, Inc. Large area group III nitride crystals and substrates, methods of making, and methods of use
EP4104201A1 (en) 2020-02-11 2022-12-21 SLT Technologies, Inc. Improved group iii nitride substrate, method of making, and method of use
US10995014B1 (en) 2020-07-10 2021-05-04 Northvolt Ab Process for producing crystallized metal sulfates
TWI745110B (zh) * 2020-10-06 2021-11-01 環球晶圓股份有限公司 半導體基板及其製造方法
JP7483669B2 (ja) 2020-11-02 2024-05-15 エスエルティー テクノロジーズ インコーポレイテッド 窒化物結晶成長のための超高純度鉱化剤及び改良された方法
CN113135593B (zh) * 2021-05-25 2022-01-28 西南科技大学 一种水热辅助溶胶-凝胶法制备高纯纳米二氧化锆的方法

Family Cites Families (121)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6065798A (ja) 1983-09-19 1985-04-15 Toyota Central Res & Dev Lab Inc 窒化ガリウム単結晶の成長方法
CN1014535B (zh) 1988-12-30 1991-10-30 中国科学院物理研究所 利用改进的矿化剂生长磷酸钛氧钾单晶的方法
US5096860A (en) 1990-05-25 1992-03-17 Alcan International Limited Process for producing unagglomerated single crystals of aluminum nitride
KR920004181B1 (ko) 1990-09-13 1992-05-30 한국과학기술연구원 입방정질화붕소의 제조방법
US5190738A (en) 1991-06-17 1993-03-02 Alcan International Limited Process for producing unagglomerated single crystals of aluminum nitride
US5306662A (en) 1991-11-08 1994-04-26 Nichia Chemical Industries, Ltd. Method of manufacturing P-type compound semiconductor
US5456204A (en) 1993-05-28 1995-10-10 Alfa Quartz, C.A. Filtering flow guide for hydrothermal crystal growth
PL173917B1 (pl) 1993-08-10 1998-05-29 Ct Badan Wysokocisnieniowych P Sposób wytwarzania krystalicznej struktury wielowarstwowej
CA2169927A1 (en) 1993-09-17 1995-03-23 Kevin Brown Pre-rinse for phosphating metal surfaces
US5679152A (en) 1994-01-27 1997-10-21 Advanced Technology Materials, Inc. Method of making a single crystals Ga*N article
US5599520A (en) 1994-11-03 1997-02-04 Garces; Juan M. Synthesis of crystalline porous solids in ammonia
US5670798A (en) 1995-03-29 1997-09-23 North Carolina State University Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact non-nitride buffer layer and methods of fabricating same
US5679965A (en) 1995-03-29 1997-10-21 North Carolina State University Integrated heterostructures of Group III-V nitride semiconductor materials including epitaxial ohmic contact, non-nitride buffer layer and methods of fabricating same
JP3728332B2 (ja) 1995-04-24 2005-12-21 シャープ株式会社 化合物半導体発光素子
DE19680872B4 (de) 1995-08-31 2009-01-08 Kabushiki Kaisha Toshiba, Kawasaki Verfahren zur Herstellung eines Licht emittierenden Elements
AU6946196A (en) 1995-09-18 1997-04-09 Hitachi Limited Semiconductor material, method of producing the semiconductor material, and semiconductor device
JP3179346B2 (ja) 1996-08-27 2001-06-25 松下電子工業株式会社 窒化ガリウム結晶の製造方法
JPH1084161A (ja) 1996-09-06 1998-03-31 Sumitomo Electric Ind Ltd 半導体レーザ及びその製造方法
US6031858A (en) 1996-09-09 2000-02-29 Kabushiki Kaisha Toshiba Semiconductor laser and method of fabricating same
WO1998019375A1 (en) 1996-10-30 1998-05-07 Hitachi, Ltd. Optical information processor and semiconductor light emitting device suitable for the same
US6177292B1 (en) 1996-12-05 2001-01-23 Lg Electronics Inc. Method for forming GaN semiconductor single crystal substrate and GaN diode with the substrate
EP2264794B1 (en) 1997-01-09 2014-11-19 Nichia Corporation Nitride semiconductor device
US6677619B1 (en) 1997-01-09 2004-01-13 Nichia Chemical Industries, Ltd. Nitride semiconductor device
US5868837A (en) 1997-01-17 1999-02-09 Cornell Research Foundation, Inc. Low temperature method of preparing GaN single crystals
PL184902B1 (pl) 1997-04-04 2003-01-31 Centrum Badan Wysokocisnieniowych Pan Sposób usuwania nierówności i obszarów silnie zdefektowanych z powierzchni kryształów i warstw epitaksjalnych GaN i Ga AL In N
JP3491492B2 (ja) 1997-04-09 2004-01-26 松下電器産業株式会社 窒化ガリウム結晶の製造方法
EP0942459B1 (en) 1997-04-11 2012-03-21 Nichia Corporation Method of growing nitride semiconductors
US5888389A (en) 1997-04-24 1999-03-30 Hydroprocessing, L.L.C. Apparatus for oxidizing undigested wastewater sludges
PL183687B1 (pl) 1997-06-06 2002-06-28 Ct Badan Sposób wytwarzania półprzewodnikowych związków grupy A-B o przewodnictwie elektrycznym typu p i typu n
TW519551B (en) 1997-06-11 2003-02-01 Hitachi Cable Methods of fabricating nitride crystals and nitride crystals obtained therefrom
US6270569B1 (en) 1997-06-11 2001-08-07 Hitachi Cable Ltd. Method of fabricating nitride crystal, mixture, liquid phase growth method, nitride crystal, nitride crystal powders, and vapor phase growth method
GB2333521B (en) 1997-06-11 2000-04-26 Hitachi Cable Nitride crystal growth method
US6593589B1 (en) 1998-01-30 2003-07-15 The University Of New Mexico Semiconductor nitride structures
US6249534B1 (en) 1998-04-06 2001-06-19 Matsushita Electronics Corporation Nitride semiconductor laser device
TW428331B (en) 1998-05-28 2001-04-01 Sumitomo Electric Industries Gallium nitride single crystal substrate and method of producing the same
JPH11340576A (ja) 1998-05-28 1999-12-10 Sumitomo Electric Ind Ltd 窒化ガリウム系半導体デバイス
JP4005701B2 (ja) 1998-06-24 2007-11-14 シャープ株式会社 窒素化合物半導体膜の形成方法および窒素化合物半導体素子
TW413956B (en) 1998-07-28 2000-12-01 Sumitomo Electric Industries Fluorescent substrate LED
US6335546B1 (en) 1998-07-31 2002-01-01 Sharp Kabushiki Kaisha Nitride semiconductor structure, method for producing a nitride semiconductor structure, and light emitting device
JP2000091637A (ja) 1998-09-07 2000-03-31 Rohm Co Ltd 半導体発光素子の製法
US6423984B1 (en) 1998-09-10 2002-07-23 Toyoda Gosei Co., Ltd. Light-emitting semiconductor device using gallium nitride compound semiconductor
US6252261B1 (en) 1998-09-30 2001-06-26 Nec Corporation GaN crystal film, a group III element nitride semiconductor wafer and a manufacturing process therefor
US6150674A (en) 1998-11-06 2000-11-21 Matsushita Electronics Corporation Semiconductor device having Alx Ga1-x N (0<x<1) substrate
TW498102B (en) 1998-12-28 2002-08-11 Futaba Denshi Kogyo Kk A process for preparing GaN fluorescent substance
US20020096674A1 (en) 1999-01-08 2002-07-25 Cho Hak Dong Nucleation layer growth and lift-up of process for GaN wafer
US6372041B1 (en) 1999-01-08 2002-04-16 Gan Semiconductor Inc. Method and apparatus for single crystal gallium nitride (GaN) bulk synthesis
JP2000216494A (ja) 1999-01-20 2000-08-04 Sanyo Electric Co Ltd 半導体発光素子およびその製造方法
EP1024524A2 (en) 1999-01-27 2000-08-02 Matsushita Electric Industrial Co., Ltd. Deposition of dielectric layers using supercritical CO2
US6177057B1 (en) 1999-02-09 2001-01-23 The United States Of America As Represented By The Secretary Of The Navy Process for preparing bulk cubic gallium nitride
ATE452445T1 (de) 1999-03-04 2010-01-15 Nichia Corp Nitridhalbleiterlaserelement
JP3957918B2 (ja) 1999-05-17 2007-08-15 独立行政法人科学技術振興機構 窒化ガリウム単結晶の育成方法
US6592663B1 (en) 1999-06-09 2003-07-15 Ricoh Company Ltd. Production of a GaN bulk crystal substrate and a semiconductor device formed on a GaN bulk crystal substrate
KR100381742B1 (ko) 1999-06-30 2003-04-26 스미토모덴키고교가부시키가이샤 Ⅲ-ⅴ족 질화물반도체의 성장방법 및 기상성장장치
JP4329229B2 (ja) 1999-06-30 2009-09-09 住友電気工業株式会社 Iii−v族窒化物半導体の成長方法および気相成長装置
JP3968920B2 (ja) 1999-08-10 2007-08-29 双葉電子工業株式会社 蛍光体
JP4646359B2 (ja) 1999-09-09 2011-03-09 シャープ株式会社 窒化物半導体発光素子の製造方法
JP2001085737A (ja) 1999-09-10 2001-03-30 Sharp Corp 窒化物半導体発光素子
US6265322B1 (en) 1999-09-21 2001-07-24 Agere Systems Guardian Corp. Selective growth process for group III-nitride-based semiconductors
CN1113988C (zh) 1999-09-29 2003-07-09 中国科学院物理研究所 一种氮化镓单晶的热液生长方法
US6398867B1 (en) 1999-10-06 2002-06-04 General Electric Company Crystalline gallium nitride and method for forming crystalline gallium nitride
EP1104031B1 (en) 1999-11-15 2012-04-11 Panasonic Corporation Nitride semiconductor laser diode and method of fabricating the same
US6653663B2 (en) 1999-12-06 2003-11-25 Matsushita Electric Industrial Co., Ltd. Nitride semiconductor device
JP2001168385A (ja) 1999-12-06 2001-06-22 Toyoda Gosei Co Ltd Iii族窒化物系化合物半導体素子及びiii族窒化物系化合物半導体発光素子
JP2001185718A (ja) 1999-12-24 2001-07-06 Hitachi Cable Ltd 窒化ガリウム系化合物半導体を用いた高電子移動度トランジスタ用エピタキシャルウェハの製造方法
US7315599B1 (en) 1999-12-29 2008-01-01 Intel Corporation Skew correction circuit
US6355497B1 (en) 2000-01-18 2002-03-12 Xerox Corporation Removable large area, low defect density films for led and laser diode growth
JP3335974B2 (ja) 2000-01-24 2002-10-21 星和電機株式会社 窒化ガリウム系半導体発光素子及びその製造方法
JP4429459B2 (ja) 2000-03-03 2010-03-10 古河電気工業株式会社 高抵抗GaN結晶層の製造方法
US20010015437A1 (en) 2000-01-25 2001-08-23 Hirotatsu Ishii GaN field-effect transistor, inverter device, and production processes therefor
US6447604B1 (en) 2000-03-13 2002-09-10 Advanced Technology Materials, Inc. Method for achieving improved epitaxy quality (surface texture and defect density) on free-standing (aluminum, indium, gallium) nitride ((al,in,ga)n) substrates for opto-electronic and electronic devices
US6596079B1 (en) 2000-03-13 2003-07-22 Advanced Technology Materials, Inc. III-V nitride substrate boule and method of making and using the same
JP3946427B2 (ja) 2000-03-29 2007-07-18 株式会社東芝 エピタキシャル成長用基板の製造方法及びこのエピタキシャル成長用基板を用いた半導体装置の製造方法
AU2001274810A1 (en) 2000-04-17 2001-10-30 Virginia Commonwealth University Defect reduction in gan and related materials
JP2001339121A (ja) 2000-05-29 2001-12-07 Sharp Corp 窒化物半導体発光素子とそれを含む光学装置
US6693935B2 (en) 2000-06-20 2004-02-17 Sony Corporation Semiconductor laser
JP2002016285A (ja) 2000-06-27 2002-01-18 National Institute Of Advanced Industrial & Technology 半導体発光素子
US6586762B2 (en) 2000-07-07 2003-07-01 Nichia Corporation Nitride semiconductor device with improved lifetime and high output power
JP3968968B2 (ja) 2000-07-10 2007-08-29 住友電気工業株式会社 単結晶GaN基板の製造方法
US6749819B2 (en) 2000-07-28 2004-06-15 Japan Pionics Co., Ltd. Process for purifying ammonia
JP4154558B2 (ja) 2000-09-01 2008-09-24 日本電気株式会社 半導体装置
JP4416297B2 (ja) 2000-09-08 2010-02-17 シャープ株式会社 窒化物半導体発光素子、ならびにそれを使用した発光装置および光ピックアップ装置
WO2002021604A1 (en) 2000-09-08 2002-03-14 Sharp Kabushiki Kaisha Nitride semiconductor light-emitting device and optical device including the same
JP2002094189A (ja) 2000-09-14 2002-03-29 Sharp Corp 窒化物半導体レーザ素子およびそれを用いた光学装置
JP2002134416A (ja) 2000-10-19 2002-05-10 Ricoh Co Ltd p型3族窒化物の結晶成長方法および製造方法、並びに半導体素子
US6936488B2 (en) 2000-10-23 2005-08-30 General Electric Company Homoepitaxial gallium-nitride-based light emitting device and method for producing
US7053413B2 (en) 2000-10-23 2006-05-30 General Electric Company Homoepitaxial gallium-nitride-based light emitting device and method for producing
JP4063520B2 (ja) 2000-11-30 2008-03-19 日本碍子株式会社 半導体発光素子
EP1346085B1 (en) 2000-11-30 2011-10-12 North Carolina State University Method for producing group iii metal nitride based materials
JP4003413B2 (ja) 2000-12-11 2007-11-07 日亜化学工業株式会社 13族窒化物結晶の製造方法
JP3785566B2 (ja) 2001-03-19 2006-06-14 株式会社日鉱マテリアルズ GaN系化合物半導体結晶の製造方法
US6806508B2 (en) 2001-04-20 2004-10-19 General Electic Company Homoepitaxial gallium nitride based photodetector and method of producing
JP2004262757A (ja) * 2001-04-24 2004-09-24 Sony Corp 窒化物半導体、半導体素子およびこれらの製造方法
PL207400B1 (pl) 2001-06-06 2010-12-31 Ammono Społka Z Ograniczoną Odpowiedzialnością Sposób i urządzenie do otrzymywania objętościowego monokryształu azotku zawierającego gal
JP4116535B2 (ja) 2001-06-06 2008-07-09 アンモノ・スプウカ・ジ・オグラニチョノン・オドポヴィエドニアウノシツィオン ガリウム含有窒化物の単結晶の製造法及び装置
US6734530B2 (en) 2001-06-06 2004-05-11 Matsushita Electric Industries Co., Ltd. GaN-based compound semiconductor EPI-wafer and semiconductor element using the same
US6488767B1 (en) 2001-06-08 2002-12-03 Advanced Technology Materials, Inc. High surface quality GaN wafer and method of fabricating same
WO2002101202A1 (en) 2001-06-08 2002-12-19 Roger Wayne Miller Rotary drive engine
US6562466B2 (en) 2001-07-02 2003-05-13 Essilor International Compagnie Generale D'optique Process for transferring a coating onto a surface of a lens blank
AU2002347692C1 (en) 2001-10-26 2008-03-06 Ammono Sp. Zo.O. Bulk monocrystalline gallium nitride
US7057211B2 (en) 2001-10-26 2006-06-06 Ammono Sp. Zo.O Nitride semiconductor laser device and manufacturing method thereof
US6949140B2 (en) 2001-12-05 2005-09-27 Ricoh Company, Ltd. Crystal growth method, crystal growth apparatus, group-III nitride crystal and group-III nitride semiconductor device
US7097707B2 (en) 2001-12-31 2006-08-29 Cree, Inc. GaN boule grown from liquid melt using GaN seed wafers
JP4513264B2 (ja) * 2002-02-22 2010-07-28 三菱化学株式会社 窒化物単結晶の製造方法
US20030209191A1 (en) 2002-05-13 2003-11-13 Purdy Andrew P. Ammonothermal process for bulk synthesis and growth of cubic GaN
PL225427B1 (pl) 2002-05-17 2017-04-28 Ammono Spółka Z Ograniczoną Odpowiedzialnością Struktura urządzenia emitującego światło, zwłaszcza do półprzewodnikowego urządzenia laserowego
WO2003097906A1 (en) 2002-05-17 2003-11-27 Ammono Sp.Zo.O. Bulk single crystal production facility employing supercritical ammonia
US20060138431A1 (en) 2002-05-17 2006-06-29 Robert Dwilinski Light emitting device structure having nitride bulk single crystal layer
PL225422B1 (pl) 2002-06-26 2017-04-28 Ammono Spółka Z Ograniczoną Odpowiedzialnością Sposób otrzymywania objętościowych monokryształów azotku zawierającego gal
AU2003258919A1 (en) 2002-06-26 2004-01-19 Ammono Sp.Zo.O. Nitride semiconductor laser device and a method for improving its performance
US7099073B2 (en) 2002-09-27 2006-08-29 Lucent Technologies Inc. Optical frequency-converters based on group III-nitrides
ATE445722T1 (de) 2002-12-11 2009-10-15 Ammono Sp Zoo Schabloneartiges substrat und verfahren zu seiner herstellung
TWI334890B (en) * 2002-12-11 2010-12-21 Ammono Sp Zoo Process for obtaining bulk mono-crystalline gallium-containing nitride, eliminating impurities from the obtained crystal and manufacturing substrates made of bulk mono-crystalline gallium-containing nitride
AU2003285766A1 (en) 2002-12-11 2004-06-30 Ammono Sp. Z O.O. Process for obtaining bulk-crystalline gallium-containing nitride
KR100902525B1 (ko) * 2003-04-03 2009-06-15 미쓰비시 가가꾸 가부시키가이샤 산화아연 단결정
US8754449B2 (en) 2004-06-11 2014-06-17 Ammono Sp. Z O.O. High electron mobility transistor (HEMT) made of layers of Group XIII element nitrides and manufacturing method thereof
KR100848380B1 (ko) 2004-06-11 2008-07-25 암모노 에스피. 제트오. 오. 갈륨 함유 질화물의 벌크 단결정 및 그의 어플리케이션
PL371405A1 (pl) 2004-11-26 2006-05-29 Ammono Sp.Z O.O. Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
US7704324B2 (en) 2005-01-25 2010-04-27 General Electric Company Apparatus for processing materials in supercritical fluids and methods thereof
US8253221B2 (en) 2007-09-19 2012-08-28 The Regents Of The University Of California Gallium nitride bulk crystals and their growth method
KR20090029697A (ko) 2006-04-07 2009-03-23 더 리전츠 오브 더 유니버시티 오브 캘리포니아 초임계 암모니아 내에서 넓은 표면적 질화 갈륨 결정을 성장시키는 방법 및 넓은 표면적 질화 갈륨 결정
WO2008051589A2 (en) 2006-10-25 2008-05-02 The Regents Of The University Of California Method for growing group iii-nitride crystals in a mixture of supercritical ammonia and nitrogen, and group iii-nitride crystals grown thereby

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2267197A1 (en) 2009-06-25 2010-12-29 AMMONO Sp.z o.o. Method of obtaining bulk mono-crystalline gallium-containing nitride, bulk mono-crystalline gallium-containing nitride, substrates manufactured thereof and devices manufactured on such substrates

Also Published As

Publication number Publication date
JP5291932B2 (ja) 2013-09-18
CN101061570A (zh) 2007-10-24
PL1859477T3 (pl) 2019-08-30
WO2006057463A1 (en) 2006-06-01
KR20070086647A (ko) 2007-08-27
EP1859477B1 (en) 2019-03-20
JP2008521737A (ja) 2008-06-26
US7905957B2 (en) 2011-03-15
CN100565800C (zh) 2009-12-02
KR101419940B1 (ko) 2014-07-16
EP1859477A1 (en) 2007-11-28
US20080156254A1 (en) 2008-07-03

Similar Documents

Publication Publication Date Title
EP1538241A3 (en) Group III nitride crystal, method of its manufacturing, and equipment for manufacturing group III nitride crystal
MY141883A (en) Process and apparatus for obtaining bulk mono-crystalline gallium-containing nitride
ATE365818T1 (de) Einkristalliner diamant
TW200741045A (en) Production methods of semiconductor crystal and semiconductor substrate
WO2008051589A3 (en) Method for growing group iii-nitride crystals in a mixture of supercritical ammonia and nitrogen, and group iii-nitride crystals grown thereby
MX2021006108A (es) Cristal de d-psicosa y procedimiento de preparacion del mismo.
MY199944A (en) Method for producing allulose crystals
EP1367150A4 (en) METHOD FOR PRODUCING SEMICONDUCTOR CRYSTAL AND SEMICONDUCTOR LIGHT ELEMENT
TW200632154A (en) Process for producing high quality large size silicon carbide crystals
GB0704516D0 (en) Diamond
WO2006127611A3 (en) Colorless single-crystal cvd diamond at rapid growth rate
JP2003511326A5 (pl)
WO2008087791A1 (ja) Iii族窒化物結晶の製造方法、iii族窒化物結晶基板およびiii族窒化物半導体デバイス
WO2005007935A3 (en) Tough diamonds and method of making thereof
TW200741044A (en) Semiconductor substrate, electronic device, optical device, and production methods therefor
JP2008510777A (ja) メソトリオンの多形体を調製する方法
WO2010129718A3 (en) Method and reactor for growing gallium nitride crystals using ammonia and hydrogen chloride
MX2009005664A (es) D-isoglutamil-d-triptofano cristalino, y la sal monoamonica de d-isoglutamil-d-triptofano.
EP1522611A4 (en) DIAMOND COMPOSITE SUBSTRATE AND MANUFACTURING METHOD THEREFOR
PL380915A1 (pl) Sposób wytwarzania azotkowego podłoża półprzewodnikowego oraz azotkowe podłoże półprzewodnikowe
ATE321039T1 (de) Verfahren zur herstellung von losartan und losartan-kaliumsalz
PL357696A1 (pl) Sposób wytwarzania podłoża standaryzowanego warstwą epitaksjalną ( podłoża typu template), z objętościowego monokrystalicznego azotku zawierającego gal, o powierzchni pod epitaksję o wysokiej jakościstrukturalnej
US10934631B1 (en) Hydrothermal generation of single crystalline molybdenum disulfide
DK1159410T3 (da) Fremgangsmåde til hurtig opnåelse af krystaller med önskelige morfologier
CN102181916B (zh) 一种提高n型111晶向电阻率均匀性的方法