JPS6375876U - - Google Patents
Info
- Publication number
- JPS6375876U JPS6375876U JP17051886U JP17051886U JPS6375876U JP S6375876 U JPS6375876 U JP S6375876U JP 17051886 U JP17051886 U JP 17051886U JP 17051886 U JP17051886 U JP 17051886U JP S6375876 U JPS6375876 U JP S6375876U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- pads
- circuit device
- insulating substrate
- bumps
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Description
第１図は、この発明の一実施例による、ＭＭＩ
Ｃ評価ジグを示す上面斜視図、第２図は、第１図
における、ＭＭＩＣ装着部の要部拡大詳細図、第
３図は、従来のＭＭＩＣ評価ジグを示す上面斜視
図である。 １…ＭＭＩＣ、３…絶縁基板、４…高周波信号
線路、５…バイアス線路、６…接地線路、１０…
バンプ、１１…バイアスパツド、１２…入力パツ
ド、１３…出力パツド、１４…接地パツド。
Ｃ評価ジグを示す上面斜視図、第２図は、第１図
における、ＭＭＩＣ装着部の要部拡大詳細図、第
３図は、従来のＭＭＩＣ評価ジグを示す上面斜視
図である。 １…ＭＭＩＣ、３…絶縁基板、４…高周波信号
線路、５…バイアス線路、６…接地線路、１０…
バンプ、１１…バイアスパツド、１２…入力パツ
ド、１３…出力パツド、１４…接地パツド。
Claims (1)
- 集積回路装置特性評価用絶縁基板上に、該集積
回路のパツド対応位置に、それぞれ該パツド圧着
接続用のバンプを対応配設したことを特徴とする
集積回路装置の評価ジグ。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17051886U JPS6375876U (ja) | 1986-11-06 | 1986-11-06 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17051886U JPS6375876U (ja) | 1986-11-06 | 1986-11-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6375876U true JPS6375876U (ja) | 1988-05-20 |
Family
ID=31105322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17051886U Pending JPS6375876U (ja) | 1986-11-06 | 1986-11-06 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6375876U (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0481668A (ja) * | 1990-07-25 | 1992-03-16 | Taiyo Kogyo Kk | プリント基板の検査装置およびピッチ変換基板 |
| WO2000004394A1 (en) * | 1998-07-16 | 2000-01-27 | Advantest Corporation | Socket for device measurement, and method of measuring device |
-
1986
- 1986-11-06 JP JP17051886U patent/JPS6375876U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0481668A (ja) * | 1990-07-25 | 1992-03-16 | Taiyo Kogyo Kk | プリント基板の検査装置およびピッチ変換基板 |
| WO2000004394A1 (en) * | 1998-07-16 | 2000-01-27 | Advantest Corporation | Socket for device measurement, and method of measuring device |