TW480617B - Substrate processing method, and substrate fabrication method - Google Patents

Substrate processing method, and substrate fabrication method Download PDF

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Publication number
TW480617B
TW480617B TW087113446A TW87113446A TW480617B TW 480617 B TW480617 B TW 480617B TW 087113446 A TW087113446 A TW 087113446A TW 87113446 A TW87113446 A TW 87113446A TW 480617 B TW480617 B TW 480617B
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TW
Taiwan
Prior art keywords
substrate
wafer
substrates
contact
central
Prior art date
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TW087113446A
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English (en)
Chinese (zh)
Inventor
Toru Takisawa
Takao Yonehara
Kenji Yamagata
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Application granted granted Critical
Publication of TW480617B publication Critical patent/TW480617B/zh

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P95/00Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04Apparatus for manufacture or treatment
    • H10P72/0428Apparatus for mechanical treatment or grinding or cutting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/19Preparing inhomogeneous wafers
    • H10P90/1904Preparing vertically inhomogeneous wafers
    • H10P90/1906Preparing SOI wafers
    • H10P90/1914Preparing SOI wafers using bonding

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
TW087113446A 1997-08-27 1998-08-14 Substrate processing method, and substrate fabrication method TW480617B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9231132A JPH1174164A (ja) 1997-08-27 1997-08-27 基板処理装置、基板支持装置及び基板処理方法並びに基板の製造方法

Publications (1)

Publication Number Publication Date
TW480617B true TW480617B (en) 2002-03-21

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Family Applications (1)

Application Number Title Priority Date Filing Date
TW087113446A TW480617B (en) 1997-08-27 1998-08-14 Substrate processing method, and substrate fabrication method

Country Status (8)

Country Link
US (2) US6451670B1 (2)
EP (1) EP0899778A3 (2)
JP (1) JPH1174164A (2)
KR (1) KR100396014B1 (2)
CN (1) CN1209644A (2)
AU (1) AU732569B2 (2)
SG (1) SG65092A1 (2)
TW (1) TW480617B (2)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI585867B (zh) * 2013-09-25 2017-06-01 芝浦機械電子裝置股份有限公司 A method of manufacturing a bonding table, a bonding apparatus and a bonded substrate

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US10586727B2 (en) 2013-09-25 2020-03-10 Shibaura Mechatronics Corporation Suction stage, lamination device, and method for manufacturing laminated substrate

Also Published As

Publication number Publication date
KR19990023901A (ko) 1999-03-25
KR100396014B1 (ko) 2003-10-17
US6451670B1 (en) 2002-09-17
JPH1174164A (ja) 1999-03-16
EP0899778A2 (en) 1999-03-03
AU8190298A (en) 1999-03-11
US6706618B2 (en) 2004-03-16
AU732569B2 (en) 2001-04-26
US20020182038A1 (en) 2002-12-05
CN1209644A (zh) 1999-03-03
US20020034859A1 (en) 2002-03-21
SG65092A1 (en) 1999-05-25
EP0899778A3 (en) 2001-03-21

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