ATE461525T1 - Prozess zum kapseln von komponenten und gekapselte komponenten - Google Patents
Prozess zum kapseln von komponenten und gekapselte komponentenInfo
- Publication number
- ATE461525T1 ATE461525T1 AT04797893T AT04797893T ATE461525T1 AT E461525 T1 ATE461525 T1 AT E461525T1 AT 04797893 T AT04797893 T AT 04797893T AT 04797893 T AT04797893 T AT 04797893T AT E461525 T1 ATE461525 T1 AT E461525T1
- Authority
- AT
- Austria
- Prior art keywords
- regions
- base substrate
- wafer level
- functional
- components
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P54/00—Cutting or separating of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W95/00—Packaging processes not covered by the other groups of this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/073—Connecting or disconnecting of die-attach connectors
- H10W72/07331—Connecting techniques
- H10W72/07337—Connecting techniques using a polymer adhesive, e.g. an adhesive based on silicone or epoxy
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/29—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/352—Materials of die-attach connectors comprising metals or metalloids, e.g. solders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
- H10W72/351—Materials of die-attach connectors
- H10W72/353—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics
- H10W72/354—Materials of die-attach connectors not comprising solid metals or solid metalloids, e.g. ceramics comprising polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/59—Bond pads specially adapted therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/932—Plan-view shape, i.e. in top view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/931—Shapes of bond pads
- H10W72/934—Cross-sectional shape, i.e. in side view
Landscapes
- Micromachines (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Dicing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Packaging Frangible Articles (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Laminated Bodies (AREA)
- Acyclic And Carbocyclic Compounds In Medicinal Compositions (AREA)
- Lubricants (AREA)
- Fats And Perfumes (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10356885A DE10356885B4 (de) | 2003-12-03 | 2003-12-03 | Verfahren zum Gehäusen von Bauelementen und gehäustes Bauelement |
| PCT/EP2004/012917 WO2005055310A2 (en) | 2003-12-03 | 2004-11-15 | Process for packaging components, and packaged components |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE461525T1 true ATE461525T1 (de) | 2010-04-15 |
Family
ID=34638391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT04797893T ATE461525T1 (de) | 2003-12-03 | 2004-11-15 | Prozess zum kapseln von komponenten und gekapselte komponenten |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US7700397B2 (de) |
| EP (1) | EP1700337B1 (de) |
| JP (2) | JP5329758B2 (de) |
| KR (1) | KR20060126636A (de) |
| CN (1) | CN1890789A (de) |
| AT (1) | ATE461525T1 (de) |
| DE (2) | DE10356885B4 (de) |
| IL (1) | IL175341A (de) |
| TW (1) | TW200524066A (de) |
| WO (1) | WO2005055310A2 (de) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10356885B4 (de) | 2003-12-03 | 2005-11-03 | Schott Ag | Verfahren zum Gehäusen von Bauelementen und gehäustes Bauelement |
| US7371676B2 (en) * | 2005-04-08 | 2008-05-13 | Micron Technology, Inc. | Method for fabricating semiconductor components with through wire interconnects |
| US7393770B2 (en) | 2005-05-19 | 2008-07-01 | Micron Technology, Inc. | Backside method for fabricating semiconductor components with conductive interconnects |
| US7307348B2 (en) * | 2005-12-07 | 2007-12-11 | Micron Technology, Inc. | Semiconductor components having through wire interconnects (TWI) |
| US7659612B2 (en) | 2006-04-24 | 2010-02-09 | Micron Technology, Inc. | Semiconductor components having encapsulated through wire interconnects (TWI) |
| US7531443B2 (en) * | 2006-12-08 | 2009-05-12 | Micron Technology, Inc. | Method and system for fabricating semiconductor components with through interconnects and back side redistribution conductors |
| US8178965B2 (en) * | 2007-03-14 | 2012-05-15 | Infineon Technologies Ag | Semiconductor module having deflecting conductive layer over a spacer structure |
| DE102007030284B4 (de) * | 2007-06-29 | 2009-12-31 | Schott Ag | Verfahren zum Verpacken von Halbleiter-Bauelementen und verfahrensgemäß hergestelltes Zwischenprodukt |
| US8580596B2 (en) * | 2009-04-10 | 2013-11-12 | Nxp, B.V. | Front end micro cavity |
| US20100320595A1 (en) * | 2009-06-22 | 2010-12-23 | Honeywell International Inc. | Hybrid hermetic interface chip |
| DE102011018295B4 (de) * | 2011-04-20 | 2021-06-24 | Austriamicrosystems Ag | Verfahren zum Schneiden eines Trägers für elektrische Bauelemente |
| KR101131782B1 (ko) | 2011-07-19 | 2012-03-30 | 디지털옵틱스 코포레이션 이스트 | 집적 모듈용 기판 |
| US9768223B2 (en) * | 2011-12-21 | 2017-09-19 | Xintec Inc. | Electronics device package and fabrication method thereof |
| TWI607534B (zh) * | 2013-04-19 | 2017-12-01 | 精材科技股份有限公司 | 晶片封裝體及其製造方法 |
| US9070747B2 (en) * | 2013-06-27 | 2015-06-30 | Flipchip International Llc | Electroplating using dielectric bridges |
| MA36343B1 (fr) * | 2013-10-14 | 2016-04-29 | Nemotek Technologies | Procédé de métallisation en cuivre destiné à la fabrication d'un circuit intégré en utilisant la technologie wafer level packaging 3d |
| KR20160090972A (ko) * | 2015-01-22 | 2016-08-02 | 에스케이하이닉스 주식회사 | 이미지 센서 패키지 및 제조 방법 |
| DE102015203393A1 (de) * | 2015-02-25 | 2016-08-25 | Infineon Technologies Ag | Halbleiterelement und Verfahren zu Herstellen von diesem |
| US10818625B1 (en) * | 2019-06-19 | 2020-10-27 | Nanya Technology Corporation | Electronic device |
| TWI863679B (zh) * | 2023-11-06 | 2024-11-21 | 矽品精密工業股份有限公司 | 基板結構、具有該基板結構之電子封裝件與製法 |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01217993A (ja) * | 1988-02-26 | 1989-08-31 | Hitachi Ltd | 半導体装置 |
| US5354695A (en) * | 1992-04-08 | 1994-10-11 | Leedy Glenn J | Membrane dielectric isolation IC fabrication |
| US5946553A (en) * | 1991-06-04 | 1999-08-31 | Micron Technology, Inc. | Process for manufacturing a semiconductor package with bi-substrate die |
| EP0547807A3 (en) * | 1991-12-16 | 1993-09-22 | General Electric Company | Packaged electronic system |
| JP2948018B2 (ja) * | 1992-03-17 | 1999-09-13 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| JPH06295962A (ja) * | 1992-10-20 | 1994-10-21 | Ibiden Co Ltd | 電子部品搭載用基板およびその製造方法並びに電子部品搭載装置 |
| JPH06244437A (ja) * | 1993-02-17 | 1994-09-02 | Oki Electric Ind Co Ltd | 半導体ウエハ |
| US5635762A (en) | 1993-05-18 | 1997-06-03 | U.S. Philips Corporation | Flip chip semiconductor device with dual purpose metallized ground conductor |
| JP4319251B2 (ja) | 1994-11-22 | 2009-08-26 | エヌエックスピー ビー ヴィ | 半導体素子を有し導体トラックが形成されている基板が接着層により結合されている支持本体を有する半導体装置 |
| JP3487524B2 (ja) * | 1994-12-20 | 2004-01-19 | 株式会社ルネサステクノロジ | 半導体装置及びその製造方法 |
| DE19620940A1 (de) * | 1995-11-17 | 1997-05-22 | Werner Prof Dr Buff | Elektronisches Bauelement und Verfahren zu seiner Herstellung |
| US6171888B1 (en) * | 1996-03-08 | 2001-01-09 | Lsi Logic Corp. | Multi-layer tab tape having distinct signal, power and ground planes, semiconductor device assembly employing same, apparatus for and method of assembling same |
| JP3170199B2 (ja) * | 1996-03-15 | 2001-05-28 | 株式会社東芝 | 半導体装置及びその製造方法及び基板フレーム |
| JP2891665B2 (ja) * | 1996-03-22 | 1999-05-17 | 株式会社日立製作所 | 半導体集積回路装置およびその製造方法 |
| US5904496A (en) | 1997-01-24 | 1999-05-18 | Chipscale, Inc. | Wafer fabrication of inside-wrapped contacts for electronic devices |
| US6051489A (en) * | 1997-05-13 | 2000-04-18 | Chipscale, Inc. | Electronic component package with posts on the active side of the substrate |
| JP3641122B2 (ja) * | 1997-12-26 | 2005-04-20 | ローム株式会社 | 半導体発光素子、半導体発光モジュール、およびこれらの製造方法 |
| IL123207A0 (en) * | 1998-02-06 | 1998-09-24 | Shellcase Ltd | Integrated circuit device |
| US6114221A (en) * | 1998-03-16 | 2000-09-05 | International Business Machines Corporation | Method and apparatus for interconnecting multiple circuit chips |
| JPH11297972A (ja) * | 1998-04-10 | 1999-10-29 | Fujitsu Ltd | 半導体装置の製造方法 |
| JP3129288B2 (ja) * | 1998-05-28 | 2001-01-29 | 日本電気株式会社 | マイクロ波集積回路マルチチップモジュール、マイクロ波集積回路マルチチップモジュールの実装構造 |
| US6075712A (en) * | 1999-01-08 | 2000-06-13 | Intel Corporation | Flip-chip having electrical contact pads on the backside of the chip |
| EP1148546A1 (de) * | 2000-04-19 | 2001-10-24 | Infineon Technologies AG | Verfahren zur Justierung von Strukturen auf einem Halbleiter-substrat |
| DE10104868A1 (de) * | 2001-02-03 | 2002-08-22 | Bosch Gmbh Robert | Mikromechanisches Bauelement sowie ein Verfahren zur Herstellung eines mikromechanischen Bauelements |
| US6717254B2 (en) * | 2001-02-22 | 2004-04-06 | Tru-Si Technologies, Inc. | Devices having substrates with opening passing through the substrates and conductors in the openings, and methods of manufacture |
| IL160189A0 (en) | 2001-08-24 | 2004-07-25 | Zeiss Stiftung | Method for producing contacts and printed circuit packages |
| AU2002333693A1 (en) * | 2001-08-24 | 2003-04-01 | Schott Glas | Method for producing micro-electromechanical components |
| DE10141571B8 (de) * | 2001-08-24 | 2005-05-25 | Schott Ag | Verfahren zum Zusammenbau eines Halbleiterbauelements und damit hergestellte integrierte Schaltungsanordnung, die für dreidimensionale, mehrschichtige Schaltungen geeignet ist |
| US6559530B2 (en) * | 2001-09-19 | 2003-05-06 | Raytheon Company | Method of integrating MEMS device with low-resistivity silicon substrates |
| TW560018B (en) * | 2001-10-30 | 2003-11-01 | Asia Pacific Microsystems Inc | A wafer level packaged structure and method for manufacturing the same |
| US7098072B2 (en) * | 2002-03-01 | 2006-08-29 | Agng, Llc | Fluxless assembly of chip size semiconductor packages |
| US6806557B2 (en) * | 2002-09-30 | 2004-10-19 | Motorola, Inc. | Hermetically sealed microdevices having a single crystalline silicon getter for maintaining vacuum |
| TWI227050B (en) * | 2002-10-11 | 2005-01-21 | Sanyo Electric Co | Semiconductor device and method for manufacturing the same |
| TWI241700B (en) * | 2003-01-22 | 2005-10-11 | Siliconware Precision Industries Co Ltd | Packaging assembly with integrated circuits redistribution routing semiconductor die and method for fabrication |
| JP2004349593A (ja) | 2003-05-26 | 2004-12-09 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
| US6777263B1 (en) * | 2003-08-21 | 2004-08-17 | Agilent Technologies, Inc. | Film deposition to enhance sealing yield of microcap wafer-level package with vias |
| DE10356885B4 (de) | 2003-12-03 | 2005-11-03 | Schott Ag | Verfahren zum Gehäusen von Bauelementen und gehäustes Bauelement |
-
2003
- 2003-12-03 DE DE10356885A patent/DE10356885B4/de not_active Expired - Fee Related
-
2004
- 2004-11-15 KR KR1020067011088A patent/KR20060126636A/ko not_active Ceased
- 2004-11-15 DE DE602004026112T patent/DE602004026112D1/de not_active Expired - Lifetime
- 2004-11-15 CN CNA2004800358730A patent/CN1890789A/zh active Pending
- 2004-11-15 WO PCT/EP2004/012917 patent/WO2005055310A2/en not_active Ceased
- 2004-11-15 JP JP2006541821A patent/JP5329758B2/ja not_active Expired - Fee Related
- 2004-11-15 AT AT04797893T patent/ATE461525T1/de not_active IP Right Cessation
- 2004-11-15 US US10/580,284 patent/US7700397B2/en not_active Expired - Fee Related
- 2004-11-15 EP EP04797893A patent/EP1700337B1/de not_active Expired - Lifetime
- 2004-11-19 TW TW093135653A patent/TW200524066A/zh unknown
-
2006
- 2006-05-01 IL IL175341A patent/IL175341A/en not_active IP Right Cessation
-
2010
- 2010-04-02 US US12/753,514 patent/US8309384B2/en not_active Expired - Fee Related
-
2012
- 2012-04-23 JP JP2012098089A patent/JP2012156551A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JP2007513507A (ja) | 2007-05-24 |
| DE10356885A1 (de) | 2005-07-07 |
| IL175341A (en) | 2010-06-30 |
| US20100187669A1 (en) | 2010-07-29 |
| US8309384B2 (en) | 2012-11-13 |
| CN1890789A (zh) | 2007-01-03 |
| JP5329758B2 (ja) | 2013-10-30 |
| IL175341A0 (en) | 2006-09-05 |
| US20080038868A1 (en) | 2008-02-14 |
| KR20060126636A (ko) | 2006-12-08 |
| EP1700337A2 (de) | 2006-09-13 |
| JP2012156551A (ja) | 2012-08-16 |
| WO2005055310A2 (en) | 2005-06-16 |
| DE10356885B4 (de) | 2005-11-03 |
| EP1700337B1 (de) | 2010-03-17 |
| US7700397B2 (en) | 2010-04-20 |
| WO2005055310A3 (en) | 2005-11-03 |
| TW200524066A (en) | 2005-07-16 |
| DE602004026112D1 (de) | 2010-04-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |