JPS6115579B2 - - Google Patents
Info
- Publication number
- JPS6115579B2 JPS6115579B2 JP53101083A JP10108378A JPS6115579B2 JP S6115579 B2 JPS6115579 B2 JP S6115579B2 JP 53101083 A JP53101083 A JP 53101083A JP 10108378 A JP10108378 A JP 10108378A JP S6115579 B2 JPS6115579 B2 JP S6115579B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- glass layer
- semiconductor substrate
- silicon
- forming
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10108378A JPS5527659A (en) | 1978-08-18 | 1978-08-18 | Method of manufacturing semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10108378A JPS5527659A (en) | 1978-08-18 | 1978-08-18 | Method of manufacturing semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5527659A JPS5527659A (en) | 1980-02-27 |
| JPS6115579B2 true JPS6115579B2 (2) | 1986-04-24 |
Family
ID=14291195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10108378A Granted JPS5527659A (en) | 1978-08-18 | 1978-08-18 | Method of manufacturing semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5527659A (2) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03504895A (ja) * | 1989-02-17 | 1991-10-24 | ベル、ヘリカプタ、テクストロン、インコーパレイティド | うず電流検出器を使用して材料を検査する方法及び保護裏当てにより未硬化の複合品シートの表面を保護する方法 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4499653A (en) * | 1983-11-03 | 1985-02-19 | Westinghouse Electric Corp. | Small dimension field effect transistor using phosphorous doped silicon glass reflow process |
| JPH063798B2 (ja) * | 1985-02-06 | 1994-01-12 | 日本電気株式会社 | 半導体装置の製造方法 |
-
1978
- 1978-08-18 JP JP10108378A patent/JPS5527659A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03504895A (ja) * | 1989-02-17 | 1991-10-24 | ベル、ヘリカプタ、テクストロン、インコーパレイティド | うず電流検出器を使用して材料を検査する方法及び保護裏当てにより未硬化の複合品シートの表面を保護する方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5527659A (en) | 1980-02-27 |
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